Invention Grant
- Patent Title: Log analysis system, log analysis method, log analysis program, and storage medium
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Application No.: US16642091Application Date: 2017-09-27
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Publication No.: US11574211B2Publication Date: 2023-02-07
- Inventor: Hideo Mitsuhashi
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2017/034930 WO 20170927
- International Announcement: WO2019/064370 WO 20190404
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06N5/04 ; G06N20/00 ; G06F11/30 ; G06F11/34 ; G06Q20/20

Abstract:
Provided is a log analysis system including: an identifying unit that identifies transactions from logs output from a device; a grouping unit that categorizes the transactions having both the same log related to start and the same log related to end into the same group; a learning unit that creates a learning model that defines the number of occurrences on a log type basis in the transactions of the same group; and an inspection unit that inspects a transaction of an inspection target based on the learning model.
Public/Granted literature
- US20200210865A1 LOG ANALYSIS SYSTEM, LOG ANALYSIS METHOD, LOG ANALYSIS PROGRAM, AND STORAGE MEDIUM Public/Granted day:2020-07-02
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