Invention Grant
- Patent Title: Deep photometric learning (DPL) systems, apparatus and methods
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Application No.: US17166976Application Date: 2021-02-03
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Publication No.: US11574413B2Publication Date: 2023-02-07
- Inventor: Matthew C. Putman , Vadim Pinskiy , Tanaporn Na Narong , Denis Sharoukhov , Tonislav Ivanov
- Applicant: Nanotronics Imaging, Inc.
- Applicant Address: US OH Cuyahoga Falls
- Assignee: Nanotronics Imaging, Inc.
- Current Assignee: Nanotronics Imaging, Inc.
- Current Assignee Address: US OH Cuyahoga Falls
- Agency: DLA Piper LLP (US)
- Main IPC: G06T7/586
- IPC: G06T7/586 ; H04N5/225 ; G06N3/08 ; G06N3/04 ; G02B21/36

Abstract:
An imaging system is disclosed herein. The imaging system includes an imaging apparatus and a computing system. The imaging apparatus includes a plurality of light sources positioned at a plurality of positions and a plurality of angles relative to a stage configured to support a specimen. The imaging apparatus is configured to capture a plurality of images of a surface of the specimen. The computing system in communication with the imaging apparatus. The computing system configured to generate a 3D-reconstruction of the surface of the specimen by receiving, from the imaging apparatus, the plurality of images of the surface of the specimen, generating, by the imaging apparatus via a deep learning model, a height map of the surface of the specimen based on the plurality of images, and outputting a 3D-reconstruction of the surface of the specimen based on the height map generated by the deep learning model.
Public/Granted literature
- US20210241478A1 Deep Photometric Learning (DPL) Systems, Apparatus and Methods Public/Granted day:2021-08-05
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