Invention Grant
- Patent Title: Nonvolatile memory device and operation method of detecting defective memory cells
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Application No.: US17359688Application Date: 2021-06-28
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Publication No.: US11574692B2Publication Date: 2023-02-07
- Inventor: Kwangho Choi , Jin-Young Kim , Se Hwan Park , Il Han Park , Ji-Sang Lee , Joonsuc Jang
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Volentine, Whitt & Francos, PLLC
- Priority: KR10-2020-0126112 20200928
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C11/56 ; G11C16/04 ; G11C16/08 ; G11C16/10 ; G11C16/16 ; G11C16/24 ; H01L25/065 ; H01L25/18 ; H01L23/00

Abstract:
A nonvolatile memory device includes a memory cell array having cell strings that each includes memory cells stacked on a substrate in a direction perpendicular to the substrate. A row decoder is connected with the memory cells through word lines. The row decoder applies a setting voltage to at least one word line of the word lines and floats the at least one word line during a floating time. A page buffer circuit is connected with the cell strings through bit lines. The page buffer senses voltage changes of the bit lines after the at least one word line is floated during the floating time and outputs a page buffer signal as a sensing result. A counter counts a number of off-cells in response to the page buffer signal. A detecting circuit outputs a detection signal associated with a defect cell based on the number of off-cells.
Public/Granted literature
- US20220101930A1 NONVOLATILE MEMORY DEVICE AND OPERATION METHOD THEREOF Public/Granted day:2022-03-31
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