The present disclosure provides a semiconductor test method. The semiconductor test method includes the operations of: receiving a source code written in an interpreted language; and performing, by a first test apparatus, a first test on a device under test (DUT) based on the source code. The operation of performing, by the first test apparatus, the first test on the DUT based on the source code includes the operations of: interpreting, by a processor, the source code to generate a first interpreted code; and performing the first test on the DUT according to the first interpreted code. The first test apparatus is configured to execute the first interpreted code written in a first language.