Invention Grant
- Patent Title: Image analysis method for multicenter study and system thereof
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Application No.: US16527678Application Date: 2019-07-31
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Publication No.: US11574726B2Publication Date: 2023-02-07
- Inventor: Kwon Ha Yoon , Seung Jin Kim , Ji Eon Kim , Si Hyung No , Tae Hoon Kim , Chang Won Jeong
- Applicant: Wonkwang University Center for Industry-Academy Cooperation
- Applicant Address: KR Jeollabuk-do
- Assignee: Wonkwang University Center for Industry-Academy Cooperation
- Current Assignee: Wonkwang University Center for Industry-Academy Cooperation
- Current Assignee Address: KR Jeollabuk-do
- Agency: The PL Law Group. PLLC
- Priority: KR10-2018-0089747 20180801
- Main IPC: G16H80/00
- IPC: G16H80/00 ; G16H30/20 ; G16H70/00 ; G16H10/20
Abstract:
An image analysis method for multicenter study includes, by a multicenter study support system, recruiting and selecting a plurality of agency systems to perform multicenter study, and then distributing an analysis guide and an analysis program corresponding to a purpose and condition of the multicenter study to each of the agency systems, by each of the agency systems, collecting analysis data acquired through the analysis guide and the analysis program and then uploading the analysis data to the multicenter study support system, and by the multicenter study support system, collecting and processing the uploaded analysis data, and then sharing the data processing result with each of the agency systems.
Public/Granted literature
- US20200043599A1 IMAGE ANALYSIS METHOD FOR MULTICENTER STUDY AND SYSTEM THEREOF Public/Granted day:2020-02-06
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