Invention Grant
- Patent Title: Aberration corrector and multiple electron beam irradiation apparatus
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Application No.: US16879919Application Date: 2020-05-21
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Publication No.: US11574793B2Publication Date: 2023-02-07
- Inventor: Kazuhiko Inoue , Munehiro Ogasawara
- Applicant: NuFlare Technology, Inc.
- Applicant Address: JP Yokohama
- Assignee: NuFlare Technology, Inc.
- Current Assignee: NuFlare Technology, Inc.
- Current Assignee Address: JP Yokohama
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JPJP2019-111578 20190614
- Main IPC: H01J37/153
- IPC: H01J37/153 ; H01J37/09 ; H01J37/141

Abstract:
Aberration corrector includes a lower electrode substrate to be formed therein with plural first passage holes having a first hole diameter and making multiple electron beams pass therethrough, and to be arranged thereon plural electrode sets each being plural electrodes of four or more poles, surrounding a first passage hole, for each of the plural first passage holes, and an upper electrode substrate above the lower one, to be formed therein with plural second passage holes making multiple electron beams pass therethrough, whose size from the top of the upper electrode substrate to the middle of way to the back side of the upper electrode substrate is a second hole diameter, and whose size from the middle to the back side is a third hole diameter larger than each of the first and second hole diameters, wherein a shield electrode is on inner walls of plural second passage holes.
Public/Granted literature
- US11605523B2 Aberration corrector and multiple electron beam irradiation apparatus Public/Granted day:2023-03-14
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