- Patent Title: Distributed inductance integrated field effect transistor structure
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Application No.: US17224762Application Date: 2021-04-07
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Publication No.: US11574854B2Publication Date: 2023-02-07
- Inventor: Nianhua (Frank) Jiang
- Applicant: NATIONAL RESEARCH COUNCIL OF CANADA
- Applicant Address: CA Ottawa
- Assignee: NATIONAL RESEARCH COUNCIL OF CANADA
- Current Assignee: NATIONAL RESEARCH COUNCIL OF CANADA
- Current Assignee Address: CA Ottawa
- Agency: Perry + Currier Inc.
- Agent Stephen J. Perry
- Main IPC: H01L49/02
- IPC: H01L49/02 ; H01L23/482 ; H01L27/085 ; H01L23/00 ; H01L23/50 ; H01L23/66 ; H01L29/08 ; H01L25/16

Abstract:
A distributed inductance integrated field effect transistor (FET) structure, comprising a plurality of FETs. Each FET comprises a plurality of source regions, a gate region having a plurality of gate fingers extending from a gate bus bar, a drain region having a plurality of drain finger extending from a drain bus bar between the plurality of gate fingers, wherein the gate region controls current flow in a conductive channel between the drain region and source region. A first distributed inductor connects the gate regions of adjacent ones of the plurality of FETs; and a second distributed inductor connects the drain regions of adjacent ones of the plurality of FETs.
Public/Granted literature
- US20210320053A1 DISTRIBUTED INDUCTANCE INTEGRATED FIELD EFFECT TRANSISTOR STRUCTURE Public/Granted day:2021-10-14
Information query
IPC分类: