Invention Grant
- Patent Title: Method for fabricating a semiconductor device with a programmable contact
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Application No.: US17319347Application Date: 2021-05-13
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Publication No.: US11575016B2Publication Date: 2023-02-07
- Inventor: Chin-Ling Huang
- Applicant: NANYA TECHNOLOGY CORPORATION
- Applicant Address: TW New Taipei
- Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee Address: TW New Taipei
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Main IPC: H01L29/423
- IPC: H01L29/423 ; H01L21/28 ; H01L29/51 ; H01L29/49 ; H01L29/417 ; H01L21/8234 ; H01L21/8238 ; H01L27/092

Abstract:
The present application discloses a method for fabricating a semiconductor device includes providing a substrate, forming a gate stack on the substrate and a pair of heavily-doped regions in the substrate, forming a programmable contact having a first width on the gate stack, and forming a first contact having a second width, which is greater than the first width, on one of the pair of heavily-doped regions.
Public/Granted literature
- US20210265476A1 METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE WITH A PROGRAMMABLE CONTACT Public/Granted day:2021-08-26
Information query
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