Invention Grant
- Patent Title: Semiconductor device and method of forming the same
-
Application No.: US17014607Application Date: 2020-09-08
-
Publication No.: US11575052B2Publication Date: 2023-02-07
- Inventor: Yu-Hsing Chang , Chern-Yow Hsu , Shih-Chang Liu
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT Law
- Agent Anthony King
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L29/94 ; H01L21/027 ; H01L23/522 ; H01L49/02 ; H01L21/768

Abstract:
A method of forming a semiconductor device includes: depositing a first conductive plate and a second conductive plate adjacent to the first conductive plate; depositing a first insulating plate on the first conductive plate and the second conductive plate; depositing a third conductive plate on the first insulating plate; depositing a second insulating plate on the third conductive plate; forming a fourth conductive plate on the second insulating plate; forming a first conductive via penetrating the fourth conductive plate, the second insulating plate, the first insulating plate, and the first conductive plate; and forming a second conductive via penetrating the second insulating plate, the third conductive plate, the first insulating plate, and the second conductive plate.
Information query
IPC分类: