Invention Grant
- Patent Title: Error sampler circuit
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Application No.: US17193067Application Date: 2021-03-05
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Publication No.: US11575546B2Publication Date: 2023-02-07
- Inventor: Abishek Manian , Nithin Sathisan Poduval , Roland Nii Ofei Ribeiro
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent John R. Pessetto; Frank D. Cimino
- Main IPC: H04L25/03
- IPC: H04L25/03 ; H03K3/037

Abstract:
An error sampler circuit includes a differential input voltage input, a differential reference voltage input, a master latch circuit, and a slave latch circuit. The master latch circuit includes a slicer circuit. The slicer circuit includes a first input, a second input, and a differential output. The first input is coupled to the differential input voltage input. The second input is coupled to the differential reference voltage input. The slave latch includes a differential input coupled to the differential output of the slicer circuit.
Public/Granted literature
- US20220286327A1 ERROR SAMPLER CIRCUIT Public/Granted day:2022-09-08
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