Invention Grant
- Patent Title: 3D test chart, adjusting arrangement, forming method and adjusting method thereof
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Application No.: US17129754Application Date: 2020-12-21
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Publication No.: US11575883B2Publication Date: 2023-02-07
- Inventor: Mingzhu Wang , Baozhong Zhang , Chunmei Liu
- Applicant: NINGBO SUNNY OPOTECH CO., LTD.
- Applicant Address: CN Ningbo
- Assignee: NINGBO SUNNY OPOTECH CO., LTD.
- Current Assignee: NINGBO SUNNY OPOTECH CO., LTD.
- Current Assignee Address: CN Ningbo
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Main IPC: H04N17/00
- IPC: H04N17/00

Abstract:
A 3D test chart, an adjusting arrangement, a forming method, and an adjusting method thereof are disclosed. The 3D test chart provides a plurality of test patterns arranged at different depths. When testing a photographic arrangement, the photographic arrangement is only required to move for one time or even does not need to be moved, so as to obtain an image containing information of different depths, so that the testing and adjusting process of the photographic arrangement can be easily achieved.
Public/Granted literature
- US20210136357A1 3D Test Chart, Adjusting Arrangement, Forming Method and Adjusting Method Thereof Public/Granted day:2021-05-06
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