Invention Grant
- Patent Title: Test apparatus
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Application No.: US17121712Application Date: 2020-12-14
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Publication No.: US11578300B2Publication Date: 2023-02-14
- Inventor: Chihiro Uematsu , Muneo Maeshima , Akira Masuya
- Applicant: Hitachi High-Tech Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Tech Corporation
- Current Assignee: Hitachi High-Tech Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2014-057138 20140319
- Main IPC: C12M1/34
- IPC: C12M1/34 ; C12M1/32 ; C12Q1/04

Abstract:
Provided is a test apparatus in which a test for bacterial identification or antimicrobial susceptibility can be promptly determined. A division state of bacteria is monitored by performing microscopic observation of shapes and the number of the bacteria in each of wells in a culture plate for bacterial identification culture or an antimicrobial susceptibility test, and it is determined whether or not the bacteria grow in a stage shifted from an induction phase to a logarithmic phase, with reference to an image obtained through microscopic observation. In addition, determination performed based on turbidity in the related art may be combined with determination performed based on microscopic observation in which change and the like in the shapes of the bacteria are monitored. Accordingly, it is possible to realize a highly accurate test result.
Public/Granted literature
- US20210189321A1 Test Apparatus Public/Granted day:2021-06-24
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