Invention Grant
- Patent Title: Bond test apparatus and method for testing the strength of bonds on electrical circuitry
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Application No.: US16462937Application Date: 2017-11-30
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Publication No.: US11579058B2Publication Date: 2023-02-14
- Inventor: Ian C. Mayes
- Applicant: NORDSON CORPORATION
- Applicant Address: US OH Westlake
- Assignee: NORDSON CORPORATION
- Current Assignee: NORDSON CORPORATION
- Current Assignee Address: US OH Westlake
- Agency: BakerHostetler
- Priority: GB1620548 20161202
- International Application: PCT/US2017/063817 WO 20171130
- International Announcement: WO2018/102476 WO 20180607
- Main IPC: G01N3/24
- IPC: G01N3/24 ; G01N5/00 ; G01N3/06 ; G01L5/00 ; G01N19/04 ; G02B21/00

Abstract:
A bond test apparatus includes a test tool, a stage for mounting a bond for testing, and a drive mechanism comprising a voice coil. The voice coil is coupled to either the stage or to the test tool and is configured to provide relative movement between the stage and the test tool such that the bond applies a test force to the test tool. The bond test apparatus can also include a velocity sensor configured to sense an instantaneous relative velocity between the stage and the test tool, and a controller configured to control the drive mechanism in response to a signal from the velocity sensor. The bond test apparatus can also include a retarding mechanism coupled to the stage or the test tool and configured to apply, in response to relative movement between the stage and the test tool, a retarding force opposing the driving force.
Public/Granted literature
- US20190310173A1 BOND TEST APPARATUS AND METHOD Public/Granted day:2019-10-10
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