Invention Grant
- Patent Title: Method and system for remote testing of devices
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Application No.: US17554017Application Date: 2021-12-17
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Publication No.: US11582134B2Publication Date: 2023-02-14
- Inventor: Sumanth Roshan Raj Manuel , Nikita Swain
- Applicant: L&T TECHNOLOGY SERVICES LIMITED
- Applicant Address: IN Chennai
- Assignee: L&T TECHNOLOGY SERVICES LIMITED
- Current Assignee: L&T TECHNOLOGY SERVICES LIMITED
- Current Assignee Address: IN Chennai
- Agent Kendal Sheets
- Main IPC: G06F15/173
- IPC: G06F15/173 ; H04L43/50 ; H04L12/46 ; H04L43/00

Abstract:
A method and system for remote testing of a plurality of devices is disclosed. The method may include receiving a request from a client system to perform testing on a set of remote devices. The local system and the client system are connected via a first network connection and the plurality of remote devices are connected to the local system via a second network connection. The method may further include receiving an input from the client system with reference to a test-suite to perform a testing action on the set of remote devices, generating a test command corresponding to the input, and transmitting the test command to each of the set of remote devices. The method may further include receiving feedback from each of the set of remote devices and transmitting the feedback to the client system.
Public/Granted literature
- US20220417129A1 METHOD AND SYSTEM FOR REMOTE TESTING OF DEVICES Public/Granted day:2022-12-29
Information query