Invention Grant
- Patent Title: OH radical measuring device and OH radical measuring method
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Application No.: US17177324Application Date: 2021-02-17
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Publication No.: US11585761B2Publication Date: 2023-02-21
- Inventor: Takao Kurata , Katsumi Takahashi , Tsutomu Hayakawa
- Applicant: IHI CORPORATION
- Applicant Address: JP Tokyo
- Assignee: IHI CORPORATION
- Current Assignee: IHI CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JPJP2018-156325 20180823
- Main IPC: G01N21/78
- IPC: G01N21/78

Abstract:
An OH radical measurement device includes a contact unit configured to bring an OH radical detection probe into contact with a gas to be measured, the OH radical detection probe including an aromatic carboxylic acid or an aromatic carboxylic acid derivative, a polar aprotic organic solvent, and a polar protic organic solvent having a content higher than a content of the polar aprotic organic solvent.
Public/Granted literature
- US20210164909A1 OH RADICAL MEASURING DEVICE AND OH RADICAL MEASURING METHOD Public/Granted day:2021-06-03
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