Invention Grant
- Patent Title: Method and system for integrity testing of sachets
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Application No.: US17050916Application Date: 2019-04-24
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Publication No.: US11585775B2Publication Date: 2023-02-21
- Inventor: Hari Krishna Salila Vijayalal Mohan , Voon Yew Aaron Thean , Suryakanta Nayak
- Applicant: NATIONAL UNIVERSITY OF SINGAPORE
- Applicant Address: SG Singapore
- Assignee: NATIONAL UNIVERSITY OF SINGAPORE
- Current Assignee: NATIONAL UNIVERSITY OF SINGAPORE
- Current Assignee Address: SG Singapore
- Agency: Volpe Koenig
- Priority: SG10201803574Y 20180427
- International Application: PCT/SG2019/050227 WO 20190424
- International Announcement: WO2019/209180 WO 20191031
- Main IPC: G01N27/24
- IPC: G01N27/24 ; B65B57/10

Abstract:
A method and system for integrity testing of sachets. The method comprises the steps of disposing at least a portion of the sachet relative to an electrode structure; applying an AC bias voltage to the electrode structure; measuring an electrical property of the portion of the sachet over a frequency range, and determining the integrity based on the measured electrical property over the frequency range.
Public/Granted literature
- US20210372961A1 METHOD AND SYSTEM FOR INTEGRITY TESTING OF SACHETS Public/Granted day:2021-12-02
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