Invention Grant
- Patent Title: Method and apparatus for detecting pixel defect of optical module, and device
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Application No.: US17051728Application Date: 2018-09-06
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Publication No.: US11587219B2Publication Date: 2023-02-21
- Inventor: Xinxin Han , Zhiyong Zhao , Nanjing Dong , Debo Sun
- Applicant: GOERTEK INC.
- Applicant Address: CN Shandong
- Assignee: GOERTEK INC.
- Current Assignee: GOERTEK INC.
- Current Assignee Address: CN Shandong
- Agency: Maschoff Brennan
- Priority: CN201810553658.3 20180531
- International Application: PCT/CN2018/104399 WO 20180906
- International Announcement: WO2019/227762 WO 20191205
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/136 ; G06T7/62 ; G06T7/11 ; G06T7/66 ; G06T7/13 ; G01N21/88 ; G09G5/10 ; H04N9/31

Abstract:
Provided are a method and an apparatus for detecting pixel defect of optical module, and a device, where the method includes: graying an image obtained by imaging a test binary image by an optical module in a darkroom environment to obtain a first grayscale image; determining a first grayscale area and a second grayscale area corresponding to two gray levels in the test binary image from the first grayscale image; determining a pixel point not matching a grayscale feature of respective grayscale region from the first grayscale area and the second grayscale area respectively as a pixel defect point; and determining the pixel defect of the optical module according to the pixel defect point. The technical solution provided in the present disclosure can detect accurately a pixel defect of an optical module which is advantageous in optimizing the processing technology of the optical module.
Public/Granted literature
- US20210248734A1 METHOD AND APPARATUS FOR DETECTING PIXEL DEFECT OF OPTICAL MODULE, AND DEVICE Public/Granted day:2021-08-12
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