According to one embodiment, an inspection apparatus includes an image generation device which generates a second image corresponding to a first image and a defect detection device which detects a defect in the second image with respect to the first image. The defect detection device is configured to extract a first partial region in which an amount of change of a luminance of the first image and an amount of change of a luminance of the second image have a correlation, and correct, in the first partial region, the luminance of the first image with respect to the luminance of the second image.