- Patent Title: Spread spectrum clock generator and spread spectrum clock generation method, pulse pattern generator and pulse pattern generation method, and error rate measuring device and error rate measuring method
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Application No.: US17551874Application Date: 2021-12-15
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Publication No.: US11588479B2Publication Date: 2023-02-21
- Inventor: Tatsuya Iwai
- Applicant: ANRITSU CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: ANRITSU CORPORATION
- Current Assignee: ANRITSU CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Pearne & Gordon LLP
- Priority: JPJP2021-019699 20210210
- Main IPC: G09G3/20
- IPC: G09G3/20 ; H03K5/156 ; G06F1/04

Abstract:
Provided are a spread spectrum clock generator and a spread spectrum clock generation method, a pulse pattern generator and a pulse pattern generation method, and an error rate measuring device and an error rate measuring method capable of improving usability when adjusting a waveform of a modulation signal during training. A setting screen 60 includes a 0-th frequency shift input unit 71 for arbitrarily setting a frequency shift of a waveform of a modulation signal in a plurality of time sections, a first frequency shift input unit 72, a second frequency shift input unit 73, a third frequency shift input unit 74, and a modulation selection unit 67 for switching a waveform pattern of the modulation signal from a first pattern to a second pattern.
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