- Patent Title: Monitoring device, method for monitoring target device, and program
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Application No.: US16301549Application Date: 2017-05-31
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Publication No.: US11591925B2Publication Date: 2023-02-28
- Inventor: Ichiro Nagano , Kuniaki Aoyama , Mayumi Saito , Shintaro Kumano , Katsuhiko Abe , Toru Tanaka , Takahiro Yamauchi
- Applicant: Mitsubishi Hitachi Power Systems, Ltd.
- Applicant Address: JP Kanagawa
- Assignee: Mitsubishi Hitachi Power Systems, Ltd.
- Current Assignee: Mitsubishi Hitachi Power Systems, Ltd.
- Current Assignee Address: JP Kanagawa
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JPJP2016-110337 20160601
- International Application: PCT/JP2017/020252 WO 20170531
- International Announcement: WO2017/209179 WO 20171207
- Main IPC: F01D17/08
- IPC: F01D17/08 ; G01M15/14 ; G05B23/02 ; F01D25/00 ; F02C7/00

Abstract:
An acquisition unit is configured to acquire measurement values of a target device. The measurement values that are acquired include at least a temperature and a flow rate of an input fluid to be input to the target device, and a temperature and a flow rate of an output fluid to be output from the target device. A correction unit is configured to obtain a correction measurement value by which the measurement values are corrected through thermal equilibrium calculations based on the measurement values. A distance calculation unit is configured to calculate a Mahalanobis distance with a factor of the correction measurement value.
Public/Granted literature
- US20190264573A1 MONITORING DEVICE, METHOD FOR MONITORING TARGET DEVICE, AND PROGRAM Public/Granted day:2019-08-29
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