Invention Grant
- Patent Title: Modular inspection system for measuring an object
-
Application No.: US16541774Application Date: 2019-08-15
-
Publication No.: US11592285B2Publication Date: 2023-02-28
- Inventor: Muhammad Umair Tahir , Oliver Zweigle , Mark Brenner , Michael Müller , Simon Raab , Steffen Kappes
- Applicant: FARO Technologies, Inc.
- Applicant Address: US FL Lake Mary
- Assignee: FARO Technologies, Inc.
- Current Assignee: FARO Technologies, Inc.
- Current Assignee Address: US FL Lake Mary
- Agency: Cantor Colburn LLP
- Main IPC: G01B11/25
- IPC: G01B11/25

Abstract:
Aspects of the present disclosure provide a system for measuring an object, the system including a plurality of frame segments. The frame segments are configured to mechanically couple together to form a frame. The plurality of frame segments includes a plurality of measurement device link segments and each of the plurality of measurement device link segments includes a measurement device which together form a plurality of measurement devices having a field of view within or adjacent to the frame. Each of the plurality of measurement devices is operable to measure three-dimensional (3D) coordinates for a plurality of points on the object. The system further includes a computing device to receive data from the plurality of measurement devices via a network established by the plurality of measurement device link segments.
Public/Granted literature
- US20210048291A1 MODULAR INSPECTION SYSTEM FOR MEASURING AN OBJECT Public/Granted day:2021-02-18
Information query