Invention Grant
- Patent Title: Systems and methods for non-destructive evaluation of optical material properties and surfaces
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Application No.: US17542152Application Date: 2021-12-03
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Publication No.: US11592286B2Publication Date: 2023-02-28
- Inventor: Yuankai Tao , Mohamed T. El-Haddad
- Applicant: Vanderbilt University
- Applicant Address: US TN Nashville
- Assignee: Vanderbilt University
- Current Assignee: Vanderbilt University
- Current Assignee Address: US TN Nashville
- Agency: Michael Best & Friedrich LLP
- Main IPC: G01B11/255
- IPC: G01B11/255 ; G01B9/02091 ; G01M11/02

Abstract:
System and methods are provided for characterizing an internal surface of a lens using interferometry measurements. Sphere-fitting a distorted radius determines distorted pathlengths. Ray-tracing simulates refraction at all upstream surfaces to determine a cumulative path length. A residual pathlength is scaled by the group-index and rays are propagated based on the phase-index. After aspheric surface fitting, a corrected radius is determined. To estimate a glass type for the lens, a thickness between focal planes of the lens surfaces is determined using RCM measurements. Then, for both surfaces, the surface is positioned into focus, interferometer path length matching is performed, a reference arm is translated to stationary phase point positions for three wavelengths to determine three per-color optical thicknesses, and ray-tracing is performed. A glass type is identified by minimizing an error function based on optical parameters of the lens and parameters determined from known glass types from a database.
Public/Granted literature
- US20220090913A1 SYSTEMS AND METHODS FOR NON-DESTRUCTIVE EVALUATION OF OPTICAL MATERIAL PROPERTIES AND SURFACES Public/Granted day:2022-03-24
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