Invention Grant
- Patent Title: Test system, transmitter, and receiver capable of executing multiple tests based on DC coupling configuration
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Application No.: US17067821Application Date: 2020-10-12
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Publication No.: US11592495B2Publication Date: 2023-02-28
- Inventor: Fei Xu , Wei-Xiong He , Feng-Cheng Chang
- Applicant: REALTEK SEMICONDUCTOR CORPORATION
- Applicant Address: TW Hsinchu
- Assignee: REALTEK SEMICONDUCTOR CORPORATION
- Current Assignee: REALTEK SEMICONDUCTOR CORPORATION
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, PC
- Priority: CN201911002398.1 20191021
- Main IPC: G01R31/52
- IPC: G01R31/52 ; G01R19/165 ; G01R19/10

Abstract:
Disclosed is a test system including a transmitter, a receiver, a measuring circuit, and a control circuit. The transmitter is coupled to the receiver in a DC coupling manner, and includes: a signal input circuit determining an output signal according to an input signal; a current source coupled between the signal input circuit and a low power-supply terminal and configured to determine a total current passing through the signal input circuit in a non-open/short-circuited condition; and a signal output wire circuit outputting the output signal for a performance test. The receiver includes: an impedance circuit coupled to the signal output wire circuit; and a coupling circuit coupling the impedance circuit with a high power-supply terminal. The measuring circuit measures a target current/voltage between the high power-supply terminal and low power-supply terminal to generate a measurement result. The control circuit determines whether the transmitter/receiver is open/short-circuited according to the measurement result.
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