Invention Grant
- Patent Title: Methods and systems for diagnosing magnetic sensors
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Application No.: US17161009Application Date: 2021-01-28
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Publication No.: US11592511B2Publication Date: 2023-02-28
- Inventor: Harish Kumar , Srinivasan Venkataraman
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Michelle F. Murray; Frank D. Cimino
- Main IPC: G01R33/07
- IPC: G01R33/07 ; G01R35/00 ; G01R33/00

Abstract:
A magnetic sensor circuit includes a plurality of magnetic sensors having bias input and bias output terminals and first and second measurement terminals. The circuit includes a diagnostic sensor having bias input and bias output terminals and first and second measurement terminals. The circuit includes a first multiplexer configured to selectively couple a current source to the bias input terminals of the magnetic sensors or to the bias input terminal of the diagnostic sensor and includes a second multiplexer configured to selectively couple the bias output terminals of the magnetic sensors or the bias output terminal of the diagnostic sensor to a first terminal of a switch. The circuit includes a third multiplexer configured to selectively couple the measurement terminals of the magnetic sensors or the measurement terminals of the diagnostic sensor to differential input terminals of an amplifier.
Public/Granted literature
- US20210373109A1 Methods and Systems for Diagnosing Magnetic Sensors Public/Granted day:2021-12-02
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