Invention Grant
- Patent Title: Method for calibrating a magnetometer
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Application No.: US16634045Application Date: 2018-07-26
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Publication No.: US11592512B2Publication Date: 2023-02-28
- Inventor: David Vissiere , Charles-Ivan Chesneau , Mathieu Hillion , Hendrik Meier , David Caruso
- Applicant: SYSNAV
- Applicant Address: FR Vernon
- Assignee: SYSNAV
- Current Assignee: SYSNAV
- Current Assignee Address: FR Vernon
- Agency: Womble Bond Dickinson (US) LLP
- Priority: FR1757082 20170726
- International Application: PCT/FR2018/051914 WO 20180726
- International Announcement: WO2019/020945 WO 20190131
- Main IPC: G01R35/00
- IPC: G01R35/00 ; G01C17/38 ; G01C25/00 ; G01R33/02

Abstract:
A method for calibrating a magnetometer. The magnetometer travels through (Si) a set of path positions, and acquires (S2) a plurality of measurements of the magnetic field. Trajectory information (S3) is provided representative of the location and the orientation of a point integral with the magnetometer. The measurements of the magnetic field are matched up (S4) with the trajectory information. A determination (S5) is made of calibration parameters of the magnetometer by the minimisation of a cost function involving, for a plurality of determination times, at least the calibration parameters, a measurement of the magnetic field, and a relationship linking the change in a magnetic field with the change in the location and in the orientation of the magnetometer derived from the trajectory information.
Public/Granted literature
- US20200233053A1 METHOD FOR CALIBRATING A MAGNETOMETER Public/Granted day:2020-07-23
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