In one embodiment, a system includes at least one projector comprising a plurality of light emitters, where the projector is configured to project a projected pattern comprising a plurality of projected features having different locations; a camera configured to capture an image comprising a detected pattern corresponding to a reflection of the projected pattern; and one or more processors configured to: identify at least one detected feature of the detected pattern, wherein the detected feature corresponds to at least one reflection of the projected features; and activate or deactivate one or more of the light emitters based on the detected feature. The light emitters may be activated or deactivated by determining a detected feature measurement based on the detected feature, and activating or deactivating one or more of the light emitters when the detected feature measurement satisfies a threshold feature measurement condition.