Invention Grant
- Patent Title: Method for detecting poor mounting state of module, and array
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Application No.: US16770536Application Date: 2018-12-12
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Publication No.: US11595002B2Publication Date: 2023-02-28
- Inventor: Takashi Iwasaki , Koji Mori , Kenji Saito , Kazushi Iyatani , Yoshikazu Kogetsu
- Applicant: SUMITOMO ELECTRIC INDUSTRIES, LTD.
- Applicant Address: JP Osaka
- Assignee: SUMITOMO ELECTRIC INDUSTRIES, LTD.
- Current Assignee: SUMITOMO ELECTRIC INDUSTRIES, LTD.
- Current Assignee Address: JP Osaka
- Agency: Oliff PLC
- Priority: JPJP2017-239388 20171214
- International Application: PCT/JP2018/045630 WO 20181212
- International Announcement: WO2019/117189 WO 20190620
- Main IPC: H02S50/15
- IPC: H02S50/15 ; H02S20/32 ; H02S40/22

Abstract:
This method for detecting a poor module-mounting-state in a concentrator photovoltaic apparatus includes: photographing a surface of an array by an imaging device; obtaining an image in which a virtual image, magnified through a condenser lens, of a light receiving portion including a cell and a vicinity thereof is formed, and a collection of pixels of the virtual image forms a composite virtual image of an entirety of the light receiving portion, the composite virtual image being projected over a plurality of modules; and detecting a poor module-mounting-state based on a form of the composite virtual image.
Public/Granted literature
- US20210167725A1 METHOD FOR DETECTING POOR MOUNTING STATE OF MODULE, AND ARRAY Public/Granted day:2021-06-03
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