Invention Grant
- Patent Title: Apparatus and method for measuring cracks in wall surface
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Application No.: US16990582Application Date: 2020-08-11
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Publication No.: US11595558B2Publication Date: 2023-02-28
- Inventor: Takashi Tanaka , Takeshi Kikuchi
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Calderon Safran & Cole P.C.
- Agent Thomas W. Cole
- Priority: JPJP2019-160880 20190904
- Main IPC: H04N5/225
- IPC: H04N5/225 ; G01B9/02 ; G01B11/00 ; G01B11/14 ; G01B11/26 ; G06T7/00 ; H04N5/33

Abstract:
A crack measuring apparatus includes distance-measuring units, an image pickup unit having pixels the positions of which are identified on an imaging device, an infrared image pickup unit having pixels the positions of which are identified on an imaging device and having sensitivity to infrared rays, driving units, angle-measuring units, and an arithmetic control unit, the arithmetic control unit searches for a cracked portion from a temperature difference in an infrared image by turning the infrared image pickup unit, captures an image of the cracked portion by the image pickup unit and identifies a position of the cracked portion from a density difference in the captured image, measures the position of the cracked portion by the distance-measuring units and the angle-measuring units, and acquires three-dimensional absolute coordinates of the cracked portion.
Public/Granted literature
- US20210067670A1 APPARATUS AND METHOD FOR MEASURING CRACKS IN WALL SURFACE Public/Granted day:2021-03-04
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