Invention Grant
- Patent Title: Method and device for interference measurement
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Application No.: US16498144Application Date: 2017-03-31
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Publication No.: US11595841B2Publication Date: 2023-02-28
- Inventor: Yukai Gao , Gang Wang
- Applicant: NEC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- International Application: PCT/CN2017/078958 WO 20170331
- International Announcement: WO2018/176367 WO 20181004
- Main IPC: H04W24/10
- IPC: H04W24/10 ; H04B17/336 ; H04W72/04 ; H04W72/08
Abstract:
Embodiments of the disclosure generally relate to interference measurement. A device determines an interference measurement pattern indicating distribution of resource elements allocated for interference measurement. Then, the device determines, based on the interference measurement pattern, an interference type for measuring interference on the resource elements.
Public/Granted literature
- US20210120443A1 METHOD AND DEVICE FOR INTERFERENCE MEASUREMENT Public/Granted day:2021-04-22
Information query
