Invention Grant
- Patent Title: Photocurable composition for making layers with high etch resistance
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Application No.: US17136920Application Date: 2020-12-29
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Publication No.: US11597781B2Publication Date: 2023-03-07
- Inventor: Fen Wan , Weijun Liu
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Abel Schillinger, LLP
- Main IPC: C08F2/50
- IPC: C08F2/50 ; B32B27/30 ; B32B27/26 ; C08F120/34

Abstract:
A photocurable composition can comprise a polymerizable material and a photoinitiator, wherein the polymerizable material can comprise at least one acrylate monomer including at least one cyano group (CN-acrylate monomer). The presence of a low amount of the CN-acrylate monomer between 10 wt % and not greater than 30 wt % can lower the contact angle of the composition and may improve the etch resistance of a photo-cured layer made from the photocurable composition.
Public/Granted literature
- US20220204659A1 PHOTOCURABLE COMPOSITION FOR MAKING LAYERS WITH HIGH ETCH RESISTANCE Public/Granted day:2022-06-30
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