Invention Grant
- Patent Title: Optical spectrum analyzer
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Application No.: US17654683Application Date: 2022-03-14
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Publication No.: US11598669B2Publication Date: 2023-03-07
- Inventor: Shinji Morimoto , Motohiro Banno , Taichi Murakami
- Applicant: ANRITSU CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: ANRITSU CORPORATION
- Current Assignee: ANRITSU CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Pearne & Gordon LLP
- Priority: JPJP2021-049882 20210324
- Main IPC: G01J3/02
- IPC: G01J3/02 ; G01J3/18 ; G02B27/28

Abstract:
An optical spectrum analyzer is provided that can separate measurement target light into orthogonal polarization components and perform measurement and enable optical spectrum measurement that does not depend on polarization of the measurement target light. Measurement target light is separated into two orthogonal polarization components, the two polarization components whose position is shifted in an engraved line direction of a diffraction grating are incident on the diffraction grating, diffracted light of the two polarization components emitted from the diffraction grating is condensed, and the condensed diffracted light is incident on an incident side end surface of a 2-core ferrule with the two polarization components adjacent to each other.
Public/Granted literature
- US20220307901A1 OPTICAL SPECTRUM ANALYZER Public/Granted day:2022-09-29
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