Invention Grant
- Patent Title: Apparatus and method for measuring creep crack growth property using small specimen with micro groove
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Application No.: US16614157Application Date: 2017-05-22
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Publication No.: US11598705B2Publication Date: 2023-03-07
- Inventor: Kee Bong Yoon , Thanh Tuan Nguyen
- Applicant: CHUNGANG UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
- Applicant Address: KR Seoul
- Assignee: CHUNGANG UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
- Current Assignee: CHUNGANG UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
- Current Assignee Address: KR Seoul
- Agency: Novick, Kim & Lee PLLC
- Agent Jae Youn Kim
- Priority: KR10-2017-0062471 20170519
- International Application: PCT/KR2017/005295 WO 20170522
- International Announcement: WO2018/212387 WO 20181122
- Main IPC: G01N3/30
- IPC: G01N3/30 ; G01N1/28 ; G01N3/02

Abstract:
An apparatus and a method for measuring a creep crack growth property using a small specimen with a micro groove are provided. The apparatus for measuring a creep crack growth property includes a lower die on which an edge of the specimen is mounted and which includes a lower die hole formed in the center thereof, an upper die coupled to an upper portion of the lower die so as to fix the specimen, and a punching unit inserted into an upper die hole formed in the center of the upper die so as to press an upper surface of the specimen, wherein a semielliptical micro groove is formed in a lower surface of the specimen to measure a creep crack growth property.
Public/Granted literature
- US20210063292A1 DEVICE AND METHOD FOR MEASURING CREEP CRACK GROWTH PROPERTIES BY USING SMALL SPECIMEN HAVING FINE GROOVE Public/Granted day:2021-03-04
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