Invention Grant
- Patent Title: Debug tool for test instruments coupled to a device under test
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Application No.: US16361816Application Date: 2019-03-22
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Publication No.: US11598804B2Publication Date: 2023-03-07
- Inventor: Jesse Armagost , Nathan Blackwell , Matthew Boelter , Geoffrey Kelly , James Neeb , Sundar Pathy , Yu Zhang , Shelby Rollins
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/317 ; G01R31/319

Abstract:
Embodiments described herein may be directed to receiving a plurality of data captured, respectively, by a plurality of test instruments coupled to a device under test, wherein a plurality of data elements within, respectively, the plurality of captured data are associated with a timestamp based upon a time a data element was captured. Embodiments may also analyze the received plurality of data captured, respectively, by the one or more test instruments, and graphically display at least a portion of the analyzed plurality of captured data to a user. Other embodiments may be identified herein.
Public/Granted literature
- US20200300912A1 DEBUG TOOL FOR TEST INSTRUMENTS COUPLED TO A DEVICE UNDER TEST Public/Granted day:2020-09-24
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