Invention Grant
- Patent Title: Method for examining distributed objects by segmenting an overview image
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Application No.: US16086270Application Date: 2017-03-17
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Publication No.: US11599738B2Publication Date: 2023-03-07
- Inventor: Iwan W. Schie , Christoph Krafft , Jürgen Popp
- Applicant: Leibniz-Institut für Photonische Technologien e.V.
- Applicant Address: DE Jena
- Assignee: Leibniz-Institut für Photonische Technologien e.V.
- Current Assignee: Leibniz-Institut für Photonische Technologien e.V.
- Current Assignee Address: DE Jena
- Agency: Hunton Andrews Kurth LLP
- Priority: DE102016105102.0 20160318
- International Application: PCT/IB2017/051554 WO 20170317
- International Announcement: WO2017/158560 WO 20170921
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/155

Abstract:
Method for examining a multiplicity of distributed objects (1) by using an overview image (200) of the area (2) in which the objects (1) are distributed, wherein the overview image (200) is converted (110) into a binary image (210) by virtue of the intensity values (202) of the pixels (201) of the overview image (200) being classified (202a, 202b) as to whether they are on the near or far side of a prescribed threshold (208); the binary image (210) is cleared (120) of structures (219) that are smaller than the objects (1), so that a cleared image (220) is produced; and the cleared image (220) is morphologically closed (130), so that a binary object mask (230) is produced that indicates which locations in the area (2) belong to objects (1) and which locations in the area (2) do not belong to an object. A computer program product, including a machine-readable program having instructions that, when the program is executed on a computer, prompt the computer and any measuring apparatus connected thereto to perform the method according to the invention.
Public/Granted literature
- US20210081633A1 METHOD FOR EXAMINING DISTRIBUTED OBJECTS BY SEGMENTING AN OVERVIEW IMAGE Public/Granted day:2021-03-18
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