Invention Grant
- Patent Title: Manufacturing method of semiconductor device
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Application No.: US17197996Application Date: 2021-03-10
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Publication No.: US11600598B2Publication Date: 2023-03-07
- Inventor: Jin Ha Kim
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si
- Agency: William Park & Associates Ltd.
- Priority: KR10-2019-0053217 20190507
- Main IPC: H01L25/065
- IPC: H01L25/065 ; H01L25/18 ; H01L23/00 ; H01L25/00 ; H01L25/16 ; H01L27/01

Abstract:
A method of manufacturing a semiconductor device includes forming a cell chip including a first substrate, a source layer on the first substrate, a stacked structure on the source layer, and a channel layer passing through the stacked structure and coupled to the source layer, flipping the cell chip, exposing a rear surface of the source layer by removing the first substrate from the cell chip, performing surface treatment on the rear surface of the source layer to reduce a resistance of the source layer, forming a peripheral circuit chip including a second substrate and a circuit on the second substrate, and bonding the cell chip including the source layer with a reduced resistance to the peripheral circuit chip.
Public/Granted literature
- US20210193627A1 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE Public/Granted day:2021-06-24
Information query
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