Invention Grant
- Patent Title: Integrated circuit structure and manufacturing method thereof
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Application No.: US17206076Application Date: 2021-03-18
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Publication No.: US11600618B2Publication Date: 2023-03-07
- Inventor: Harry-Hak-Lay Chuang , Li-Feng Teng , Wei-Cheng Wu , Fang-Lan Chu , Ya-Chen Kao
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Maschoff Brennan
- Main IPC: H01L27/092
- IPC: H01L27/092 ; H01L29/08 ; H01L29/423 ; H01L29/417 ; H01L29/49 ; H01L29/78 ; H01L21/28 ; H01L21/8238 ; H01L29/66 ; H01L27/11

Abstract:
A includes depositing a gate electrode layer over a semiconductor substrate; patterning the gate electrode layer into a first gate electrode and a gate electrode extending portion; forming a first gate spacer alongside the first gate electrode; patterning the gate electrode extending portion into a second gate electrode after forming the first gate spacer; and forming a second gate spacer alongside the second gate electrode and a third gate spacer around the first spacer.
Public/Granted literature
- US20220302114A1 INTEGRATED CIRCUIT STRUCTURE AND MANUFACTURING METHOD THEREOF Public/Granted day:2022-09-22
Information query
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