Invention Grant
- Patent Title: Semiconductor structure with dielectric fin in memory cell and method for forming the same
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Application No.: US17521389Application Date: 2021-11-08
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Publication No.: US11600624B2Publication Date: 2023-03-07
- Inventor: Jhon-Jhy Liaw
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: H01L27/11
- IPC: H01L27/11 ; H01L27/092 ; H01L29/66 ; H01L21/8238

Abstract:
A semiconductor structure is provided. The semiconductor structure includes a first dielectric fin, a first semiconductor fin and a second dielectric fin over a substrate. The first semiconductor fin interposes between and is spaced apart from the first dielectric fin and the second dielectric fin. The semiconductor structure also includes a first source/drain structure over a source/drain portion of the first semiconductor fin, an inter-layer dielectric layer covering a first portion of an upper surface of the first source/drain structure and an upper surface of the second dielectric fin, and a first contact in the inter-layer dielectric layer and covering a second portion of the upper surface of the first source/drain structure and an upper surface of the first dielectric fin.
Public/Granted literature
- US20220059548A1 SEMICONDUCTOR STRUCTURE WITH DIELECTRIC FIN IN MEMORY CELL AND METHOD FOR FORMING THE SAME Public/Granted day:2022-02-24
Information query
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