Invention Grant
- Patent Title: Semiconductor device structure integrating air gaps and methods of forming the same
-
Application No.: US17308258Application Date: 2021-05-05
-
Publication No.: US11600699B2Publication Date: 2023-03-07
- Inventor: Chih-Ching Wang , Kuan-Lun Cheng , Wen-Hsing Hsieh
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: NZ Carr Law Office
- Main IPC: H01L29/08
- IPC: H01L29/08 ; H01L21/768 ; H01L23/528 ; H01L23/532 ; H01L29/06 ; H01L29/417 ; H01L29/423

Abstract:
A semiconductor device structure, along with methods of forming such, are described. In one embodiment, a semiconductor device structure is provided. The semiconductor device structure a first source/drain region, a second source/drain region, and a gate stack disposed between the first source/drain region and the second source/drain region. The semiconductor device structure also includes a conductive feature disposed below the first source/drain region. The semiconductor device structure also includes a power rail disposed below and in contact with the conductive feature. semiconductor device structure also includes a dielectric layer enclosing the conductive feature, wherein an air gap is formed between the dielectric layer and the conductive feature.
Public/Granted literature
- US20220359657A1 SEMICONDUCTOR DEVICE STRUCTURE INTEGRATING AIR GAPS AND METHODS OF FORMING THE SAME Public/Granted day:2022-11-10
Information query
IPC分类: