Invention Grant
- Patent Title: Semiconductor element and semiconductor device
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Application No.: US16549070Application Date: 2019-08-23
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Publication No.: US11600722B2Publication Date: 2023-03-07
- Inventor: Takeyoshi Nishimura
- Applicant: FUJI ELECTRIC CO., LTD.
- Applicant Address: JP Kawasaki
- Assignee: FUJI ELECTRIC CO., LTD.
- Current Assignee: FUJI ELECTRIC CO., LTD.
- Current Assignee Address: JP Kawasaki
- Priority: JPJP2018-182824 20180927
- Main IPC: H01L29/78
- IPC: H01L29/78

Abstract:
Provided are a semiconductor element and a semiconductor device capable of achieving on-resistance reduction and miniaturization. The semiconductor element is used in a semiconductor switch for protecting an electric circuit, and includes a semiconductor substrate SB, a MOS transistor Tr provided on the semiconductor substrate SB, and a source electrode SE provided on a front surface 2a side of the semiconductor substrate SB. The MOS transistor Tr includes an n-type source region 8 connected to the source electrode SE, an n-type drift region 21 arranged away from the source region 8, and a p-type well region 31 arranged between the source region 8 and the drift region 21. The source region 8 is interposed between the source electrode SE and the well region 31.
Information query
IPC分类: