Invention Grant
- Patent Title: System and method for generation of quality metrics for optimization tasks in topology synthesis of a network
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Application No.: US17129950Application Date: 2020-12-22
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Publication No.: US11601357B2Publication Date: 2023-03-07
- Inventor: Moez Cherif , Benoit de Lescure
- Applicant: ARTERIS, INC.
- Applicant Address: US CA Campbell
- Assignee: ARTERIS, INC.
- Current Assignee: ARTERIS, INC.
- Current Assignee Address: US CA Campbell
- Agency: Dana Legal Services
- Agent Jubin Dana
- Main IPC: G06F15/173
- IPC: G06F15/173 ; H04L45/12 ; H04L45/02 ; H04L45/302 ; H04L45/42

Abstract:
System and methods are disclosed to qualify networks properties and that can be used for topology synthesis of networks, such as a network-on-chip (NoC). In accordance with various embodiments and different aspects of the invention, quality metric are generated, analyzed, and used to determine a quantitative quality set of values for a given generated solution for a network. The method disclosed allows the network designer or an automated network generation process to understand if the results produced are a good, an average or a bad solution. The advantage of the invention includes simplification of design process and the work of the designer by using quality metrics. Various quality metrics are generated using network definitions. These quality metrics provide quality evaluation and the quality assessment of the optimization process for a generated (optimized) network. The quality metrics include analyzing latency through a network and analyzing total wore length used by the network.
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