Various embodiments include systems and apparatuses for reducing contamination levels within optical chambers of particle-detection instruments. In one embodiment, an apparatus to reduce contamination within an optical chamber of a particle-detection instrument is described. The apparatus includes a plenum chamber to at least partially surround an aerosol-focusing nozzle of the particle-detection instrument and accept a filtered gas flow. A curtain-flow concentrating nozzle is coupled to the plenum chamber to produce a curtain flow into the optical chamber to substantially surround an aerosol flow. Other methods and systems are disclosed.