Disclosed herein is a differential probe, a testing device having at least one such differential probe, and a method for producing the same. The differential probe has a first half-probe and a second half-probe, at least one conductor loop pair having a conductor loop of each half-probe being shaped mirror-inverted relative to each other and, in respect of a mirror-inverted arrangement thereof on respective sides of a mirror plane. The conductor loops are oriented parallel to the mirror plane, are arranged offset relative to each other in an offset direction, also parallel to the mirror plane, wherein the conductor loops overlap in part in the direction normal to the mirror plane.