Invention Grant
- Patent Title: Condition monitoring system
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Application No.: US16954232Application Date: 2018-02-23
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Publication No.: US11604447B2Publication Date: 2023-03-14
- Inventor: Tomoaki Hiruta , Hideaki Suzuki , Takayuki Uchida , Akihiro Komasu
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- International Application: PCT/JP2018/006658 WO 20180223
- International Announcement: WO2019/163084 WO 20190829
- Main IPC: G05B19/042
- IPC: G05B19/042

Abstract:
A condition monitoring system which collects operation data from a machine and monitors a condition of the machine includes: a storage unit that stores information indicating components of a first machine for which a model for a sensor data analysis has been created and components of a second machine for which the model is newly created, information indicating a correspondence relationship between the components of the first machine and the components of the second machine, and information relating to the model; a model creation unit that creates model candidates of the second machine from the model similar to the second machine by using the information stored in the storage unit, and creating information relating to a model candidate selected via an input unit out of the model candidates as the model of the second machine; and a display unit that displays the model candidates.
Public/Granted literature
- US20210055706A1 CONDITION MONITORING SYSTEM Public/Granted day:2021-02-25
Information query
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