A production line test method, system and device for a PCIE Switch product, and a medium. The method comprises: connecting to ports of a target PCIT Switch product using cables according to a preset rule, and controlling a target configuration file to run using a target controller such that the target PCIE Switch product enters a test state, wherein the target configuration file is a file pre-stored in the target PCIE Switch product, and the target controller is a controller pre-connected to the target PCIE Switch product; reading the current running information of the target PCIE Switch product and determining whether the current running information satisfies a preset condition; and if yes, determining that a production line of the target PCIE Switch product is normal. Hence, the method can greatly improve the test efficiency of a production line of a target PCIE Switch product.