A device for analyzing a grain sample including a light source, an image sensor, and a controller. The light source is configured for illuminating the grain sample. The image sensor is configured for capturing images of the grain sample. The controller is coupled to the image sensor and is configured for receiving the images of the grain sample therefrom and for analyzing the images to detect at least one material other than grain in the grain sample. The light source is configured for illuminating the grain sample with a local light spot having a size that is smaller than a width of an average wheat kernel. The image analysis and the detection of material other than grain may, at least partly, be performed using trained neural networks and other artificial intelligence algorithms.