Invention Grant
- Patent Title: Apparatus for measuring implant osseointegration
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Application No.: US16311983Application Date: 2017-05-23
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Publication No.: US11607131B2Publication Date: 2023-03-21
- Inventor: Yong Heum Lee , Soo Byeong Kim , Na Ra Lee
- Applicant: UNIVERSITY INDUSTRY FOUNDATION, YONSEI UNIVERSITY WONJU CAMPUS
- Applicant Address: KR Wonju-si
- Assignee: UNIVERSITY INDUSTRY FOUNDATION, YONSEI UNIVERSITY WONJU CAMPUS
- Current Assignee: UNIVERSITY INDUSTRY FOUNDATION, YONSEI UNIVERSITY WONJU CAMPUS
- Current Assignee Address: KR Wonju-si
- Agency: Cantor Colburn LLP
- Priority: KR10-2016-0077251 20160621
- International Application: PCT/KR2017/005352 WO 20170523
- International Announcement: WO2017/222194 WO 20171228
- Main IPC: A61B5/00
- IPC: A61B5/00 ; A61C19/04 ; A61C8/02 ; A61C8/00

Abstract:
Provided is an apparatus for measuring implant osseointegration, and the apparatus for measuring implant osseointegration includes: a vibration generation unit configured to apply multiple vibrations with frequencies in different bands, respectively, to an implant fixture; a vibration sensor configured to measure three-axis vibration information of the implant fixture caused by the vibrations from the vibration generation unit; and a control unit configured to determine the degree of osseointegration based on the measured vibration information.
Public/Granted literature
- US20190192003A1 APPARATUS FOR MEASURING IMPLANT OSSEOINTEGRATION Public/Granted day:2019-06-27
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