Invention Grant
- Patent Title: Spectral analysis apparatus and spectral analysis method
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Application No.: US16755720Application Date: 2018-09-26
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Publication No.: US11609181B2Publication Date: 2023-03-21
- Inventor: Masashi Fukuhara , Kazuhiko Fujiwara , Yoshihiro Maruyama
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu
- Agency: Faegre Drinker Biddle & Reath LLP
- Priority: JPJP2017-200176 20171016
- International Application: PCT/JP2018/035764 WO 20180926
- International Announcement: WO2019/077955 WO 20190425
- Main IPC: G01N21/27
- IPC: G01N21/27 ; G01N21/65 ; G06K9/62 ; G06N3/04 ; G06N3/08 ; G06V10/70 ; G06V10/82

Abstract:
A spectrum analysis apparatus is an apparatus for analyzing an analysis object on the basis of a spectrum of light generated in the analysis object containing any one or two or more of a plurality of reference objects, and includes an array conversion unit, a processing unit, a learning unit, and an analysis unit. The array conversion unit generates two-dimensional array data on the basis of a spectrum of light generated in the reference object or the analysis object. The processing unit includes a deep neural network. The analysis unit causes the array conversion unit to generate the two-dimensional array data on the basis of the spectrum of light generated in the analysis object, inputs the two-dimensional array data to the deep neural network, and analyzes the analysis object on the basis of data output from the deep neural network.
Public/Granted literature
- US20210190679A1 SPECTRAL ANALYSIS APPARATUS AND SPECTRAL ANALYSIS METHOD Public/Granted day:2021-06-24
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