- Patent Title: Localization and classification of abnormalities in medical images
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Application No.: US17809385Application Date: 2022-06-28
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Publication No.: US11610308B2Publication Date: 2023-03-21
- Inventor: Ali Kamen , Tongbai Meng , Mamadou Diallo , Bin Lou , Xin Yu , David Jean Winkel , Dorin Comaniciu , Robert Grimm , Berthold Kiefer , Heinrich von Busch
- Applicant: Siemens Healthcare GmbH
- Applicant Address: DE Erlangen
- Assignee: Siemens Healthcare GmbH
- Current Assignee: Siemens Healthcare GmbH
- Current Assignee Address: DE Erlangen
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G06T7/11 ; G06N20/00 ; G06K9/62

Abstract:
Systems and methods are provided for classifying an abnormality in a medical image. An input medical image depicting a lesion is received. The lesion is localized in the input medical image using a trained localization network to generate a localization map. The lesion is classified based on the input medical image and the localization map using a trained classification network. The classification of the lesion is output. The trained localization network and the trained classification network are jointly trained.
Public/Granted literature
- US20220358648A1 LOCALIZATION AND CLASSIFICATION OF ABNORMALITIES IN MEDICAL IMAGES Public/Granted day:2022-11-10
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