Invention Grant
- Patent Title: Wafer-yields and write-QoS in flash-based solid state drives
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Application No.: US16925158Application Date: 2020-07-09
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Publication No.: US11610641B2Publication Date: 2023-03-21
- Inventor: Aman Bhatia , Fan Zhang
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Weaver Austin Villeneuve & Sampson LLP
- Main IPC: G11C29/44
- IPC: G11C29/44 ; G11C16/10 ; G11C11/56 ; G11C16/04 ; G11C29/04 ; G06F12/02 ; G06F3/06 ; G11C29/00

Abstract:
A non-volatile data storage device includes memory cells arranged in a plurality of blocks and a memory controller coupled to the memory cells for controlling operations of the memory cells. The memory controller is configured to determine if a given block is a bad m-bit multi-level block. In an m-bit multi-level block, each memory cell is an m-bit multi-level cell (MLC), m being an integer equal to or greater than 2. Upon determining that the given block is a good m-bit multi-level block, the memory controller assigns the given block to be an m-bit multi-level user block. Upon determining that the given block is a bad m-bit multi-level block, the memory controller determines if the given block is a good n-bit block. In an n-bit block, each memory cell is an n-bit cell, n being an integer less than m. Upon determining that the given block is a good n-bit block, the memory controller assigns the given block to be an n-bit user block or an n-bit write-buffer block.
Public/Granted literature
- US20220013191A1 WAFER-YIELDS AND WRITE-QOS IN FLASH-BASED SOLID STATE DRIVES Public/Granted day:2022-01-13
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