Invention Grant
- Patent Title: Semiconductor device and method of manufacturing semiconductor device
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Application No.: US16875457Application Date: 2020-05-15
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Publication No.: US11610882B2Publication Date: 2023-03-21
- Inventor: Hiroyuki Nakamura , Shinya Soneda
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Studebaker & Brackett PC
- Priority: JP2017-085001 20170424
- Main IPC: H01L27/07
- IPC: H01L27/07 ; H01L27/06 ; H01L29/06 ; H01L29/66 ; H01L29/739 ; H01L29/16 ; H01L29/20 ; H01L29/36 ; H01L29/08 ; H01L29/10 ; H01L29/861

Abstract:
A semiconductor device includes a semiconductor substrate in which a first region having a freewheeling diode arranged therein, second regions having an IGBT arranged therein, and a withstand-voltage retention region surrounding the first region and the second regions in plan view are defined. The semiconductor substrate has a first main surface and a second main surface. The semiconductor substrate includes an anode layer having a first conductivity type, which is arranged in the first main surface of the first region, and a diffusion layer having the first conductivity type, which is arranged in the first main surface of the withstand-voltage retention region adjacently to the anode layer. A first trench is arranged in the first main surface on a side of the anode layer with respect to a boundary between the anode layer and the diffusion layer.
Public/Granted literature
- US20200279843A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2020-09-03
Information query
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